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Hernandez, S., J. Lopez-Vidrier, L. Lopez-Conesa, D. Hiller, S. Gutsch, J. Ibanez, S. Estrade, F. Peiro, M. Zacharias, and B. Garrido (2014), Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering, Journal of Applied Physics, 115(20), doi: 10.1063/1.4878175.