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Hernández, S., J. López-Vidrier, L. López-Conesa, D. Hiller, S. Gutsch, J. Ibáñez, S. Estradé, F. Peiró, M. Zacharias, and B. Garrido (2014), Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering, Journal of Applied Physics, 115(20).